Miller FPP-5000 4-Point Probe
|Miller FPP-5000 4-Point Probe|
|Sample Size||pieces up to 4" and 6" wafers|
|Supported Processes||Supported Processes|
The Miller FPP-5000 4-Point Probe is used to measure resistive properties of semiconductor wafers and thin films.
- None at this time.
- This tool is typically used to measure sheet resistance, but can also be set up to to calculate and display V/I, resistivity, and thickness.
- Measurement ranges:
- Sheet resistance: 1.1 mΩ/square to 450 kΩ/square
- V/I: 0.25 mΩ to 99.9 kΩ
- Slice resistivity: 4.12E-2 mΩ-cm to 17.1 kΩ-cm
- Thickness: 20 Å to 243 kÅ
- Self calibration and zero circuitry ensures high accuracy of ±0.5% on all readings between 5 mΩ to 5 kΩ. No more than ±8.0% at the extreme limits of the range.
- Optional penetrate function available to breakdown thin oxide layers. If selected, a 4 ms pulse of ~200 V is applied to probes before the measurement is taken. This pulse should be sufficient to break through approximately 700 Å of SiO2 or 2200 Å of Al203.
- Optional dopant type test is also available for doped layers. A rectification test is performed first, followed by a thermal test if needed. If the results are inconclusive the N and P indicators are simultaneously illuminated.
- Voltage Detector Impedance: 1E12 Ω
- Current source range: 250 nA to 500 mA
- Current source voltage compliance at 500 mA: -45 V
- Probe spacing = 0.0625 inches = 1.59 mm
- Separate sample holders (back pressure plate and ring) are available for pieces, 4" and 6" wafers.
- Sample must be larger than ~ 1 cm x 1 cm (probe head width is 4.8 mm).
- Samples smaller than 2.5 inches in diameter require a geometric correction factor. Please see Four point probe technology page for more information.
The Miller FPP-5000 4-Point Probe is designated as a General class tool. Below is a list of approved materials for the tool. Approved means the material is allowed in the tool under normal circumstances. If a material is not listed, please create a helpdesk ticket or email firstname.lastname@example.org for any material requests or questions.
Sheet resistance, V/I, slice resistivity, and thickness functions are selectable by push buttons on the front panel of the tool. See the Standard Operating Procedure (SOP) below for more details.
Standard operating procedure
This SOP 's Equipment Manual does not follow the LNF Equipment Manual Guidelines.
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- Read through this page and the Standard Operating Procedure above.
- Create a Helpdesk Ticket requesting training.
- A tool engineer will arrange a time with you to schedule the tool for training and checkout.
Probe head is replaced and unit is sent out for calibration as needed.
Users are not authorized to perform any maintenance on this equipment.