Changes
Jump to navigation
Jump to search
← Older edit
Newer edit →
Stylus profilometry
18 bytes removed
,
5 years ago
m
→Applications
==Applications==
{{prose|section}}
Stylus profilometry is often used for measuring step heights and feature sizes for samples that have been patterned and etched.
The physical dimensions of the stylus cause limitations in what can be measured with this method.
Bkarmstr
Administrator, LabUser, OnlineAccess, PhysicalAccess, Staff, StoreManager, StoreUser
467
edits
Navigation menu
Personal tools
English
Log In
Namespaces
Page
Discussion
Variants
Views
Read
View source
View history
More
Search
Navigation
lnf.umich.edu
Main page
Announcements
Capabilities
User Resources
Safety
Recent changes
Random page
Help
Tools
Special pages
Printable version