Administrator, LabUser, OnlineAccess, PhysicalAccess, Staff, StoreManager, StoreUser
467
edits
Changes
Jump to navigation
Jump to search
{{lead too short}}
{{warning|This page has not been released yet.}}
no edit summary
<!--
Fill out anything between the %percent signs% but don't include the percent signs.
<!--|materials = %Optional materials processed%-->
}}
[[{{PAGENAME}}|{{PAGENAME}}{{#if: {{#var:acronym}} | ({{#var:acronym}})|}}]] uses elliptically polarized light reflected off of the measurement sample to allow for extraction of both thickness and optical constants (n,k or e1,e2) for transparent and semi-transparent thin films.
