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Confocal laser optical profilometry

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[[{{PAGENAME}}|{{PAGENAME}}{{#if: {{#var:acronym}} | &nbsp;({{#var:acronym}})|}}]] is an optical 3D surface profiling technology.
===Olympus OLS 4000 LEXT===
{{main|Olympus OLS 4000 LEXT}}
==Method of operation==
*This technique is based on confocal microscope configuration using high numerical aperture objectives which have a very narrow depth of focus. Only the "in focus" reflected light passes through the confocal pinhole.
*A laser is scanned in X/Y across field of view on the sample surface.
*Confocal laser optical profilometry can be used for measuring surface roughness, sample topography, etched pattern step heights, and feature sizes.
*This technique and [[Scanning white light interferometry|scanning white light interferometry]] (SWLI) are particularly useful for characterizing the depth of high aspect ratio trench features which can not be measured using stylus profilometry. [Stylus profilometry] is only capable of a maximum aspect ratio of ~1 (or less depending on feature size) and a maximum step height of 150um due to physical dimensions and limitations of the stylus.
Optional description of materials that can be processed by technology. I think the best example of where this comes in handy would be with LPCVD describing the difference between HTO and LTO.
===Olympus OLS 4000 LEXT===
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{{main|Olympus OLS 4000 LEXT}}
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