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[[{{PAGENAME}}|{{PAGENAME}}{{#if: {{#var:acronym}} |  ({{#var:acronym}})|}}]] uses elliptically polarized light reflected off of the measurement sample to allow for extraction of both thickness and optical constants (n,k or e1,e2) for transparent and semi-transparent thin films.

==Method of operation==

*Elliptically polarized light is reflected from the measurement sample and is analyzed in p- and s- vector components.

==Applications==

Ellipsometry is most often used for the characterization of thin film thickness and material optical constants.

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==See also==