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Energy Dispersive X-ray Spectroscopy

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[[{{PAGENAME}}|{{PAGENAME}}{{#if: {{#var:acronym}} |  ({{#var:acronym}})|}}]] Energy Dispersive Analysis is an analytical technique that can give quantitave and qualitative information on the elements that are present in an specimen. EDS takes advantage of the x-ray generated on a sample by the high energy electron beam of the Scanning Electron Microscope (SEM). Each atom releases x-rays whose finger print is unique to that atom.
 
==Equipment==
 
{{main|Hitachi SU8000 In-line FE-SEM}}
{{main|Bruker Quantax EDS}}
Both technique use the same exciting source and are housed in the same equipment.
 
==Method of operation==
The electron beam (>15KV) generates mainly two types of excited electrons (secondaries and primary backscattered) as the electrons leave the sample, the specimen charges (ionizes) in order to relax (neutralize) the atoms, a higher level electron moves into a lower level and the extra energy is released in the form of x-rays. These x-rays are a result of energy level transition within the energy levels of the atom therefore the eneryy liberated is characteristic of each atom. <br />
This technique is a very useful tool for the identification and quantification of the elements present in a sample.
==Equipment==
 
{{main|Hitachi SU8000 In-line FE-SEM}}
{{main|Bruker Quantax EDS}}
Both technique use the same exciting source and are housed in the same equipment.
==See also==
Administrator, LabUser, OnlineAccess, PhysicalAccess, Staff, StoreManager, StoreUser
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