Difference between revisions of "Aluminum"

From LNF Wiki
Jump to navigation Jump to search
Line 3: Line 3:
 
{{#vardefine:restriction|0}} <!-- Set the Material Restriction Level: 1 = CMOS Clean, 2 = Semi-Clean, 3 = Metals, 4 = varies -->
 
{{#vardefine:restriction|0}} <!-- Set the Material Restriction Level: 1 = CMOS Clean, 2 = Semi-Clean, 3 = Metals, 4 = varies -->
 
Aluminum is a metal that is a silvery-white, soft, non-magnetic and ductile in the boron group.  
 
Aluminum is a metal that is a silvery-white, soft, non-magnetic and ductile in the boron group.  
==Applications==
+
==Processing Equipment==
*Discuss common uses/applications for this material. Why this materials is used in the LNF?
+
Process technologies that can be used to deposit/pattern this material. If this is a substrate, refer to what tool/process restrictions there may be and possibly remove the following sub-sections.
 
 
 
===Deposition Equipment===
 
===Deposition Equipment===
 
*[[Lab 18-2]]
 
*[[Lab 18-2]]
Line 21: Line 20:
 
*[[Dektak XT Surface Profilometer]]
 
*[[Dektak XT Surface Profilometer]]
  
==Processing Equipment==
+
==Applications==
Process technologies that can be used to deposit/pattern this material.  If this is a substrate, refer to what tool/process restrictions there may be and possibly remove the following sub-sections.
+
*Aluminum is a commonly deposited metal in the lab. It has a high reflectivity for optical devices.
  
 
==Processes==
 
==Processes==

Revision as of 09:01, 22 April 2020

Warning Warning: This page has not been released yet.

Aluminum is a metal that is a silvery-white, soft, non-magnetic and ductile in the boron group.

Processing Equipment

Process technologies that can be used to deposit/pattern this material. If this is a substrate, refer to what tool/process restrictions there may be and possibly remove the following sub-sections.

Deposition Equipment

Etching Equipment

Characterization Equipment

Applications

  • Aluminum is a commonly deposited metal in the lab. It has a high reflectivity for optical devices.

Processes

Depositoin Processes

Etch Processes

Characterization Processes

  • The profilometer can be used to measure the thickness of your deposition.

References