Difference between revisions of "LAM 9400/Processes/LNF Poly"

From LNF Wiki
Jump to navigation Jump to search
(9 intermediate revisions by the same user not shown)
Line 10: Line 10:
 
[[Category:Processes]] [[Category:RIE]]
 
[[Category:Processes]] [[Category:RIE]]
  
LNF_Poly is designed for etching si and polysilicon in the LAM 9400.  This recipe is currently under development and will replace poly_etch_2 as it does not have the same stability problems.
+
LNF_Poly is designed for etching [[Silicon|Si]] and [[Polysilicon]] in the LAM 9400.  This recipe produces a very vertical sidewall angle and has a high selectively to oxide (~18:1).
  
 
==Etch Rates==
 
==Etch Rates==
*Si - 2800 Å/min
+
* Polysilicon - 2340 Å/min (blanket 150mm poly)
 +
*Si - 2800 Å/min (<10% open area)
 
*SPR 220 (3.0) - 275 Å/min
 
*SPR 220 (3.0) - 275 Å/min
 
*SiO<sub>2</sub> - 150 Å/min
 
*SiO<sub>2</sub> - 150 Å/min
Line 22: Line 23:
 
|height=400
 
|height=400
 
|border=0
 
|border=0
}
+
}}
  
 
==Parameters==
 
==Parameters==
Line 61: Line 62:
  
 
==Sidewall Profile==
 
==Sidewall Profile==
[[File:LAM_9400_LNF_Poly_2um_grating.jpg|400px]]
+
* Nearly a 90 degree sidewall angle
 +
 
 +
<gallery mode="packed-hover"  heights="300px">
 +
File:LAM_9400_LNF_Poly_2um_grating.jpg|LNF_Poly for 600 sec, 2 µm grating
 +
File:LAM_9400_LNF_Poly_10um_grating.jpg|LNF_Poly for 600 sec, 10 µm grating
 +
</gallery>
  
 
==Limitations==
 
==Limitations==
 +
To remove the photoresist a ~20 sec dip in 100:1 HF is necessary before nanostrip.

Revision as of 12:41, 20 October 2021


About this Process
Process Details
Equipment LAM 9400
Technology RIE
Material Poly
Mask Materials PR
Gases Used HBr, He
Date Created 2016

LNF_Poly is designed for etching Si and Polysilicon in the LAM 9400. This recipe produces a very vertical sidewall angle and has a high selectively to oxide (~18:1).

Etch Rates

  • Polysilicon - 2340 Å/min (blanket 150mm poly)
  • Si - 2800 Å/min (<10% open area)
  • SPR 220 (3.0) - 275 Å/min
  • SiO2 - 150 Å/min

Parameters

Parameter Breakthrough Main Etch
Time 10 sec variable
Pressure 5 mTorr 30 mTorr
TCP Power 300 W 600 W
Bias Power 100 W 90 W
Cl2 Flow 60 sccm 0 sccm
HBr Flow 0 sccm 100 sccm
He Flow 0 sccm 100 sccm

Sidewall Profile

  • Nearly a 90 degree sidewall angle

Limitations

To remove the photoresist a ~20 sec dip in 100:1 HF is necessary before nanostrip.