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Ellipsometry

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[[{{PAGENAME}}|{{PAGENAME}}{{#if: {{#var:acronym}} |  ({{#var:acronym}})|}}]] uses elliptically polarized light reflected off of the measurement sample to allow for extraction of both thickness and optical constants (n,k or e1,e2) for transparent and semi-transparent thin films.
==Equipment==
 
===Woollam M-2000 Ellipsometer===
{{main|Woollam M-2000 Ellipsometer}}
Spectroscopic ellipsometer with 190-1700nm wavelength range.
 
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<categorytree mode=pages>{{#var:acronym|{{PAGENAME}}}} equipment</categorytree>
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==Method of operation==
*Elliptically polarized light is reflected from the measurement sample and is analyzed in p- and s- vector components.
==Applications==
{{expand section}}
Ellipsometry is most often used for the characterization of thin film thickness and material optical constants.
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==Equipment==
 
===Woollam M-2000 Ellipsometer===
{{main|Woollam M-2000 Ellipsometer}}
Spectroscopic ellipsometer with 190-1700nm wavelength range.
<!--===Complete tool list===
<categorytree mode=pages>{{#var:acronym|{{PAGENAME}}}} equipment</categorytree>
-->
==See also==
Administrator, LabUser, OnlineAccess, PhysicalAccess, Staff, StoreManager, StoreUser
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